ECE354 hw6.doc-NEW JERSEY INSTITUTE OF T...
ECE354_hw6.doc-NEW JERSEY INSTITUTE OF TECHNOLOGY DEPT.
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ECE354 hw6.doc-NEW JERSEY INSTITUTE...
ECE354_hw6.doc-NEW JERSEY INSTITUTE OF TECHNOLOGY DEPT.
##### Page 1
NEW JERSEY INSTITUTE OF TECHNOLOGY
DEPT. OF ELECTRICAL & COMPUTER ENGINEERING
SEMESTER 1
ECE354
DIGITAL TEST
HW 6
Refer to the following circuit whenever applicable:
Fig. 1. Circuit for HW6
1.
The LFSR of Fig. 2 is inserted with the seed G1G2G3G4=0001. The LFSR is continuously
clocked until the original seed appears again. Compute the states of one full cycle of this
1

##### Page 2
LFSR. How many states are traversed in a full cycle (every state is counted only once in this
count)? Does this LFSR implement a primitive polynomial?
2.
The LFSR of Fig. 2 is used to generate patterns to test the circuit of Fig. 1. The test set is the
full cycle you have computed in Pb. 1, where the first pattern in the set is the initial seed.
The LFSR of Fig. 3 is used to capture the responses of the circuit to this test. The initial seed
of this LFSR is S1S2S3=000. Compute the good circuit signature captured in the LFSR of
Fig. 3 at the end of the test.
3.
If the circuit of Fig. 1 possesses the fault
A
/0, will the test described in Pb. 2 detect it?
4.
If the circuit of Fig. 1 possesses the fault
, will the test described in Pb. 2 detect it?
5.
If the circuit of Fig. 1 possesses the fault
, will the test described in Pb. 2 detect it?
2

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